X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 6.5
Temperature 297.0
Details 1.5 M AMMONIUM SULFATE 100 MM TRIS (PH 6.5) 2.5 % PEG 400 1.0 % DIOXANE, VAPOR DIFFUSION, HANGING DROP, temperature 297K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 70.42 α = 90
b = 128.65 β = 90
c = 91.57 γ = 90
Symmetry
Space Group C 2 2 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
2 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE MARRESEARCH -- 1998-11-14
IMAGE PLATE MARRESEARCH -- 1988-06-01
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON EMBL/DESY, HAMBURG BEAMLINE BW7B -- EMBL/DESY, Hamburg BW7B
SYNCHROTRON MPG/DESY, HAMBURG BEAMLINE BW6 -- MPG/DESY, HAMBURG BW6

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.7 30 95.9 0.111 -- -- 2.8 31909 11302 -- -- 37.9
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.7 2.85 88.2 0.462 -- -- 2.7 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 2.7 37.3 -- 3.0 -- 9316 469 79.2 -- 0.205 0.205 0.249 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.7 2.87 -- 53 990 0.268 0.381 0.052 54.8
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model CONSTRAINED
Mean Isotropic B 56.9
Anisotropic B[1][1] 25.56
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -23.35
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -2.21
RMS Deviations
Key Refinement Restraint Deviation
c_improper_angle_d 0.89
c_mcbond_it 7.41
c_scangle_it 15.8
c_mcangle_it 9.12
c_angle_deg 1.6
c_dihedral_angle_d 18.0
c_bond_d 0.012
c_scbond_it 12.2
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.28
Luzzati Sigma A (Observed) 0.34
Luzzati Resolution Cutoff (Low) 5.0
Luzzati ESD (R-Free Set) 0.36
Luzzati Sigma A (R-Free Set) 0.51
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1622
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 93

Software

Software
Software Name Purpose
SHARP phasing
CNS refinement version: 0.9
DENZO data reduction
SCALEPACK data scaling