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X-RAY DIFFRACTION
Materials and Methods page
1CLS
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 62.8 α = 90
    b = 82.47 β = 99.24
    c = 53.3 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Detector
    Detector AREA DETECTOR
    Type SIEMENS
    Collection Date 1994-01-04
     
    Diffraction Radiation
     
    Diffraction Source
    Wavelength 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 0.0
    Number Reflections(Observed) 42167
    Percent Possible(Observed) 99.6
    R Merge I(Observed) 0.09
    Redundancy 2.58
     
     
  •   Refinement Hide
    Refinement Statistics
    reflnsShellList 1.9
    Resolution(Low) 6.0
    Cut-off Sigma(F) 2.0
    Number of Reflections(Observed) 33545
    R-Work 0.168
     
    Temperature Factor Modeling
    Mean Isotropic B Value 19.95
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    p_transverse_tor 32.8
    p_staggered_tor 17.5
    p_planar_tor 3.5
    p_xyhbond_nbd 0.226
    p_multtor_nbd 0.191
    p_bond_d 0.018
    p_angle_d 0.039
    p_planar_d 0.039
    p_mcbond_it 0.729
    p_mcangle_it 1.189
    p_scbond_it 1.515
    p_scangle_it 2.319
    p_plane_restr 0.024
    p_chiral_restr 0.2
    p_singtor_nbd 0.276
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4384
    Nucleic Acid Atoms 0
    Heterogen Atoms 196
    Solvent Atoms 478
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XENGEN
    Structure Refinement GPRLSA
     
    Software
    refinement GPRLSA