X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 98.9 α = 90
b = 98.9 β = 90
c = 191.4 γ = 120
Symmetry
Space Group P 31 2 1

Diffraction

Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE MARRESEARCH -- 1994-07-14
Diffraction Radiation
Monochromator Protocol
-- --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON EMBL/DESY, HAMBURG BEAMLINE X11 -- EMBL/DESY, HAMBURG X11

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
-- -- 95.2 0.068 -- -- 2.9 -- 81881 -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 1.9 7.0 -- 2.0 -- 81837 -- -- -- 0.204 0.204 -- --
RMS Deviations
Key Refinement Restraint Deviation
x_bond_d 0.014
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 4213
Nucleic Acid Atoms 0
Heterogen Atoms 4
Solvent Atoms 369

Software

Computing
Computing Package Purpose
XDS Data Reduction (intensity integration)
ARP/WARP, X-PLOR Structure Solution
ARP/WARP, X-PLOR Structure Refinement
Software
Software Name Purpose
X-PLOR refinement
ARP/wARP refinement
X-PLOR model building
ARP/wARP model building