X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
pH 7.5
Details pH 7.5

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 102.6 α = 90
b = 66.61 β = 131.57
c = 99.71 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Detector
Detector Diffraction Type Details Collection Date
AREA DETECTOR SIEMENS X1000 -- 1994-07-14
Diffraction Radiation
Monochromator Protocol
-- --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
-- -- -- -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
-- -- 99.0 0.081 -- -- 2.85 -- 32710 -- 0.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 2.0 12.0 -- 3.0 -- 28286 -- 83.3 -- 0.178 0.178 -- --
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 21.5
RMS Deviations
Key Refinement Restraint Deviation
x_bond_d 0.011
x_angle_deg 1.66
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 4090
Nucleic Acid Atoms 0
Heterogen Atoms 1
Solvent Atoms 248

Software

Computing
Computing Package Purpose
XENGEN Data Reduction (intensity integration)
X-PLOR Structure Solution
X-PLOR Structure Refinement
Software
Software Name Purpose
X-PLOR refinement
X-PLOR model building
XENGEN data collection