X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 35.12 α = 90
b = 67.36 β = 93.9
c = 37.05 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE MAR scanner 300 mm plate -- --
Diffraction Radiation
Monochromator Protocol
-- --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON EMBL/DESY, HAMBURG BEAMLINE X11 -- EMBL/DESY, HAMBURG X11

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
-- -- 93.3 0.039 -- -- 2.07 -- 86474 -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 1.0 15.0 -- 0.0 86474 -- -- 93.3 0.094 -- -- 0.119 --
RMS Deviations
Key Refinement Restraint Deviation
s_angle_d 0.028
s_bond_d 0.023
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1439
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 264

Software

Computing
Computing Package Purpose
DENZO Data Reduction (intensity integration)
SHELXL-93 Structure Solution
SHELXL-93 Structure Refinement
Software
Software Name Purpose
SHELXL-93 refinement
SHELXL-93 model building
DENZO data collection