X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 51.4 α = 90
b = 84.33 β = 90
c = 87.5 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE MARRESEARCH -- 1995-06
Diffraction Radiation
Monochromator Protocol
-- --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON EMBL/DESY, HAMBURG BEAMLINE X11 -- EMBL/DESY, Hamburg X11

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.3 50 94.1 0.089 -- -- 6.5 -- 16218 -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 2.3 10.0 -- -- -- 15950 -- -- -- 0.178 0.178 0.246 --
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 20.8
RMS Deviations
Key Refinement Restraint Deviation
x_angle_deg 1.4
x_improper_angle_d 1.2
x_dihedral_angle_d 23.3
x_bond_d 0.009
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2805
Nucleic Acid Atoms 0
Heterogen Atoms 23
Solvent Atoms 221

Software

Software
Software Name Purpose
ARP/wARP model building
X-PLOR model building
X-PLOR refinement
DENZO data reduction
X-PLOR phasing