X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 4
Temperature 20.0
Details PEG 8000, SODIUM ACETATE, pH 4.0, VAPOR DIFFUSION, HANGING DROP, temperature 20.0K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 40.4 α = 90
b = 84.1 β = 90
c = 134.3 γ = 90
Symmetry
Space Group P 2 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 293
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE MARRESEARCH -- 1995-11-05
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU RU200 -- -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.6 20 88.0 0.13 -- -- 5.0 -- 15749 -- 1.0 30.0
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.6 2.7 55.0 0.3 -- -- 1.5 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 2.6 12.0 -- 1.0 -- 15749 1575 -- -- 0.205 0.205 0.27 RANDOM
RMS Deviations
Key Refinement Restraint Deviation
x_bond_d 0.01
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3322
Nucleic Acid Atoms 0
Heterogen Atoms 23
Solvent Atoms 114

Software

Computing
Computing Package Purpose
X-PLOR Structure Refinement
Software
Software Name Purpose
X-PLOR refinement