X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 59.9 α = 90
b = 112.7 β = 90
c = 301.8 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE FUJI -- 1993-10
Diffraction Radiation
Monochromator Protocol
-- --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON CHESS BEAMLINE F1 -- CHESS F1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
-- -- -- 0.115 -- -- 3.9 -- n/a -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 2.4 30.0 -- 0.0 -- 74306 -- -- -- 0.208 -- -- --
RMS Deviations
Key Refinement Restraint Deviation
t_gen_planes 0.008
t_trig_c_planes 0.006
t_dihedral_angle_d 20.193
t_angle_deg 2.715
t_bond_d 0.016
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 10354
Nucleic Acid Atoms 0
Heterogen Atoms 5
Solvent Atoms 73

Software

Computing
Computing Package Purpose
PURDUE (OSC) Data Reduction (intensity integration)
TNT Structure Refinement
Software
Software Name Purpose
TNT refinement