X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion
pH 8.5
Details VAPOR DIFFUSION AGAINST 3.6M NA,K PHOSPHATE, pH 8.5, vapor diffusion

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 34.03 α = 90
b = 34.47 β = 90
c = 43.47 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 123
Diffraction Detector
Detector Diffraction Type Details Collection Date
AREA DETECTOR SIEMENS X-1000 -- --
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
-- -- -- -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.2 50 97.5 0.06 -- -- 5.6 -- 15400 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.2 1.4 83.8 0.166 -- -- 3.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
OTHER 1.2 50.0 -- 0.0 14030 -- -- 97.5 -- 0.137 -- 0.166 EVERY 10TH REFLECTION
RMS Deviations
Key Refinement Restraint Deviation
s_angle_d 0.022
s_anti_bump_dis_restr 2.6
s_bond_d 0.022
Coordinate Error
Parameter Value
Number Disordered Residues 7.0
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 439
Nucleic Acid Atoms 0
Heterogen Atoms 1
Solvent Atoms 159

Software

Software
Software Name Purpose
SHELXL-93 refinement
XDS data reduction
XSCALE data scaling