X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 75.39 α = 90
b = 22.58 β = 90
c = 28.6 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 125
Diffraction Detector
Detector Diffraction Type Details Collection Date
DIFFRACTOMETER SIEMENS -- 1984-06
Diffraction Radiation
Monochromator Protocol
-- --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
-- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 1.09 10.0 -- 0.0 -- 20740 -- -- -- 0.187 -- -- --
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 454
Nucleic Acid Atoms 0
Heterogen Atoms 5
Solvent Atoms 167

Software

Computing
Computing Package Purpose
SIEMENS XDISK Data Reduction (intensity integration)
SHELXL-93 Structure Solution
SHELXL-93, XFIT Structure Refinement
Software
Software Name Purpose
XFIT refinement
SHELXL-93 refinement
SHELXL-93 model building
SIEMENS version: XDISK data collection