X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
pH 6
Details pH 6.0

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 127.5 α = 90
b = 97.7 β = 90
c = 164.2 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 287
Diffraction Detector
Detector Diffraction Type Details Collection Date
AREA DETECTOR SIEMENS -- 1994-07
Diffraction Radiation
Monochromator Protocol
GRAPHITE(002) --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE MACSCIENCE M18XH -- -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.8 21 81.6 0.176 0.176 -- 2.7 -- 41759 -- 0.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.8 2.98 57.3 0.476 0.476 0.581 1.75 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.8 21.0 -- 0.0 -- 41579 2078 81.6 -- 0.17 0.17 0.226 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.8 2.9 -- 123 2337 0.288 0.36 -- 49.0
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model RESTRAINED
RMS Deviations
Key Refinement Restraint Deviation
x_scangle_it 5.72
x_scbond_it 3.47
x_mcangle_it 2.77
x_mcbond_it 1.47
x_improper_angle_d 1.01
x_bond_d 0.015
x_angle_deg 2.6
x_dihedral_angle_d 25.0
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 10800
Nucleic Acid Atoms 0
Heterogen Atoms 1622
Solvent Atoms 345

Software

Computing
Computing Package Purpose
XENGEN Data Reduction (intensity integration)
XENGEN Data Reduction (data scaling)
X-PLOR 3.8 Structure Solution
X-PLOR 3.8 Structure Refinement
Software
Software Name Purpose
X-PLOR version: 3.8 refinement
X-PLOR version: 3.8 model building
XENGEN data reduction
XENGEN data collection