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X-RAY DIFFRACTION
Materials and Methods page
1BN1
  •   Crystallization Hide
    Crystallization Experiments
    pH 10
    Details pH 10.0
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 42.7 α = 90
    b = 41.7 β = 104.6
    c = 73 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 298
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type RIGAKU RAXIS
    Details MIRRORS
    Collection Date 1994-06
     
    Diffraction Radiation
    Monochromator NI FILTER
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU RUH2R
    Wavelength 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.1
    Resolution(Low) 6.5
    Number Reflections(Observed) 13725
    Percent Possible(Observed) 93.1
    R Merge I(Observed) 0.063
    Redundancy 3.5
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method OTHER
    reflnsShellList 2.1
    Resolution(Low) 6.5
    Cut-off Sigma(F) 2.0
    Number of Reflections(Observed) 13151
    Percent Reflections(Observed) 93.1
    R-Factor(Observed) 0.166
    R-Work 0.166
     
    Temperature Factor Modeling
    Data Not Available
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    x_improper_angle_d 1.3
    x_bond_d 0.008
    x_angle_deg 1.7
    x_dihedral_angle_d 25.3
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2041
    Nucleic Acid Atoms 0
    Heterogen Atoms 23
    Solvent Atoms 128
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) CCP4
    Structure Solution X-PLOR 3.1
    Structure Refinement X-PLOR 3.1
     
    Software
    refinement X-PLOR version: 3.1
    model building X-PLOR version: 3.1