X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 58.36 α = 90
b = 58.36 β = 90
c = 56.04 γ = 90
Symmetry
Space Group P 42 21 2

Diffraction

Diffraction Detector
Detector Diffraction Type Details Collection Date
-- SIEMENS -- 1900-01-01
Diffraction Radiation
Monochromator Protocol
-- --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
-- -- -- -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.6 6 88.5 0.0348 -- -- -- -- 11511 -- 3.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 1.6 6.0 -- 3.0 -- 11511 -- -- -- 0.187 0.187 -- --
RMS Deviations
Key Refinement Restraint Deviation
x_bond_d 0.02
x_angle_deg 3.35
x_dihedral_angle_d 1.98
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 827
Nucleic Acid Atoms 0
Heterogen Atoms 57
Solvent Atoms 64

Software

Computing
Computing Package Purpose
XENGEN Data Reduction (intensity integration)
X-PLOR 3.0 Structure Solution
X-PLOR 3.0 Structure Refinement
Software
Software Name Purpose
X-PLOR version: 3.0 refinement
X-PLOR version: 3.0 model building