X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 155.46 α = 90
b = 96.92 β = 90
c = 55.85 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE RIGAKU -- 1993-03-15
Diffraction Radiation
Monochromator Protocol
-- --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON PHOTON FACTORY BEAMLINE BL-6A -- PHOTON FACTORY BL-6A

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
-- -- 99.0 0.115 -- -- 4.3 -- 31874 -- 3.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 2.4 8.0 -- 0.0 -- 31758 -- -- -- -- -- -- --
RMS Deviations
Key Refinement Restraint Deviation
p_bond_d 0.018
p_angle_d 0.059
p_planar_d 0.011
p_chiral_restr 0.248
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 5298
Nucleic Acid Atoms 0
Heterogen Atoms 14
Solvent Atoms 121

Software

Computing
Computing Package Purpose
WEIS Data Reduction (intensity integration)
PROLSQ Structure Refinement
Software
Software Name Purpose
PROLSQ refinement
WEIS data collection