X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 127.51 α = 90
b = 96.69 β = 96.63
c = 46.96 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE FUJI -- 1900-01-01
Diffraction Radiation
Monochromator Protocol
-- --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON PHOTON FACTORY BEAMLINE BL-6B -- PHOTON FACTORY BL-6B

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
-- -- 76.7 0.076 -- -- 2.2 -- 40067 -- 1.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 1.8 6.0 -- 2.0 -- 35508 -- -- -- 0.195 0.195 0.234 --
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 21.42
RMS Deviations
Key Refinement Restraint Deviation
x_bond_d 0.005
x_angle_deg 1.23
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.2
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 4107
Nucleic Acid Atoms 0
Heterogen Atoms 38
Solvent Atoms 345

Software

Computing
Computing Package Purpose
WEIS Data Reduction (intensity integration)
X-PLOR Structure Refinement
Software
Software Name Purpose
X-PLOR refinement