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X-RAY DIFFRACTION
Materials and Methods page
1AUJ
  •   Crystallization Hide
    Crystallization Experiments
    pH 6.6
    Details pH 6.6
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 55 α = 90
    b = 58.4 β = 90
    c = 67.6 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 273
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type RIGAKU
    Collection Date 1995-09
     
    Diffraction Radiation
    Monochromator NI FILTER
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU RUH2R
    Wavelength 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 2.1
    Percent Possible(Observed) 90.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method DIFFERENCE
    reflnsShellList 2.1
    Resolution(Low) 8.0
    Cut-off Sigma(F) 1.0
    Percent Reflections(Observed) 90.0
    R-Factor(Observed) 0.169
    R-Work 0.169
     
    Temperature Factor Modeling
    Data Not Available
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    x_bond_d 0.011
    x_angle_deg 1.9
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1629
    Nucleic Acid Atoms 0
    Heterogen Atoms 33
    Solvent Atoms 140
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) R-AXIS
    Data Reduction (data scaling) R-AXIS
    Structure Solution X-PLOR 3.1
    Structure Refinement X-PLOR 3.1
     
    Software
    refinement X-PLOR version: 3.1
    model building X-PLOR version: 3.1
    data reduction R-AXIS version: SOFTWARE
    data collection R-AXIS version: SOFTWARE