X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 211.27 α = 90
b = 145.35 β = 90
c = 86.19 γ = 90
Symmetry
Space Group P 21 21 2

Diffraction

Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE MARRESEARCH -- 1992-01-01
Diffraction Radiation
Monochromator Protocol
-- --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
-- -- 87.0 0.088 -- -- 2.9 -- 46698 -- 1.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 3.0 7.0 -- 3.0 -- 42994 -- 80.0 -- 0.203 0.203 -- --
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 30.0
RMS Deviations
Key Refinement Restraint Deviation
x_angle_deg 2.3
x_bond_d 0.012
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.34
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 7892
Nucleic Acid Atoms 3204
Heterogen Atoms 62
Solvent Atoms 0

Software

Software
Software Name Purpose
X-PLOR model building
X-PLOR refinement
MOSFLM data reduction
MARXDS data reduction
X-PLOR phasing