X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 132.4 α = 90
b = 53 β = 107.1
c = 170.6 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Detector
Detector Diffraction Type Details Collection Date
AREA DETECTOR SIEMENS-NICOLET X100 -- 1994-04-08
Diffraction Radiation
Monochromator Protocol
-- --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
-- -- -- -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.9 -- 72.0 -- -- -- 2.6 -- 65092 -- 2.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 2.2 8.0 -- 2.0 -- 51337 -- 91.0 -- 0.193 0.193 -- --
RMS Deviations
Key Refinement Restraint Deviation
x_bond_d 0.007
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.2
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 7660
Nucleic Acid Atoms 0
Heterogen Atoms 176
Solvent Atoms 645

Software

Computing
Computing Package Purpose
XENGEN V. 2.0 Data Reduction (intensity integration)
X-PLOR 3.1 Structure Solution
X-PLOR 3.1 Structure Refinement
Software
Software Name Purpose
X-PLOR version: 3.1 refinement
X-PLOR version: 3.1 model building