X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 113.54 α = 90
b = 113.54 β = 90
c = 137.53 γ = 120
Symmetry
Space Group P 31 2 1

Diffraction

Diffraction Detector
Detector Diffraction Type Details Collection Date
AREA DETECTOR XENTRONICS -- 1993-05-15
Diffraction Radiation
Monochromator Protocol
-- --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
-- -- 1.5418 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
-- -- 98.0 0.118 -- -- 3.08 -- 25272 -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 2.8 8.0 -- 0.0 -- 24138 -- -- -- 0.188 0.188 0.235 --
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 22.0
RMS Deviations
Key Refinement Restraint Deviation
x_bond_d 0.011
x_angle_deg 1.72
x_dihedral_angle_d 24.11
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 5036
Nucleic Acid Atoms 0
Heterogen Atoms 22
Solvent Atoms 297

Software

Software
Software Name Purpose
XDS data scaling
X-PLOR model building
X-PLOR refinement
XDS data reduction
X-PLOR phasing