X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 36.3 α = 110.8
b = 40.5 β = 109
c = 45.7 γ = 63.3
Symmetry
Space Group P 1

Diffraction

Diffraction Detector
Detector Diffraction Type Details Collection Date
AREA DETECTOR SIEMENS-NICOLET X100 -- 1990
Diffraction Radiation
Monochromator Protocol
-- --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
-- -- -- -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.63 -- 98.0 0.076 -- -- 4.8 -- 27634 -- 0.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 1.63 10.0 -- 0.0 -- 25745 -- 97.4 -- 0.194 0.194 -- --
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 35.0
RMS Deviations
Key Refinement Restraint Deviation
x_scangle_it 5.0
x_scbond_it 3.5
x_mcangle_it 2.0
x_mcbond_it 1.5
x_bond_d 0.007
x_angle_deg 1.29
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.23
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1675
Nucleic Acid Atoms 0
Heterogen Atoms 62
Solvent Atoms 131

Software

Computing
Computing Package Purpose
XDS, SYNDUC Data Reduction (intensity integration)
X-PLOR 3.1 Structure Solution
X-PLOR 3.1 Structure Refinement
Software
Software Name Purpose
X-PLOR version: 3.1 refinement
X-PLOR version: 3.1 model building