X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
pH 6
Details AS DESCRIBED IN KENDREW,J.C. AND PARRISH,R.G., PROC. ROY. SOC. A (LONDON) 238, 305-324 (1956), pH 6.0

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 63.45 α = 90
b = 30.44 β = 105.7
c = 34.13 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 40
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE FUJI YES 1993-06-30
Diffraction Radiation
Monochromator Protocol
YES --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X26C -- NSLS X26C

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.69 27.5 95.8 0.05 -- -- 3.3 -- 13618 -- 0.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.69 1.77 83.5 0.146 -- 5.0 2.7 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
DIFFERENCE FOURIER 1.69 10.0 -- 2.0 -- 13511 1375 95.3 -- 0.171 0.171 0.234 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.69 1.77 -- 139 1380 0.231 0.259 -- 87.4
RMS Deviations
Key Refinement Restraint Deviation
x_bond_d 0.014
x_dihedral_angle_d 18.8
x_improper_angle_d 1.5
x_angle_deg 1.5
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.16
Luzzati Sigma A (Observed) 0.08
Luzzati Resolution Cutoff (Low) 10.0
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1217
Nucleic Acid Atoms 0
Heterogen Atoms 45
Solvent Atoms 193

Software

Software
Software Name Purpose
X-PLOR model building
X-PLOR refinement
DENZO data reduction
CCP4 data scaling
X-PLOR phasing