X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 84.98 α = 90
b = 78.69 β = 118.32
c = 89.28 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE MARRESEARCH -- 1993-10-10
Diffraction Radiation
Monochromator Protocol
-- --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
-- -- 0.92 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
-- -- -- 0.092 -- -- 3.4 -- n/a -- -- 29.5

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 2.0 8.0 -- 1.0 -- 62465 -- 93.5 -- 0.226 -- -- --
RMS Deviations
Key Refinement Restraint Deviation
t_trig_c_planes 0.006
t_nbd 0.018
t_it 3.44
t_dihedral_angle_d 24.9
t_angle_deg 2.9
t_incorr_chiral_ct 0.0
t_bond_d 0.013
t_gen_planes 0.011
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 6142
Nucleic Acid Atoms 0
Heterogen Atoms 52
Solvent Atoms 529

Software

Software
Software Name Purpose
TNT refinement
XDS data reduction