X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
pH 7
Details TF-5G9 CRYSTAL WERE GROWN IN 1.7-2.0M AMMONIUM SULFATE, 0.1M SODIUM CITRATE, PH 5.0-5.5, 0.2% 2-METHYL-2,4-PENTANE-DIOL (MPD), AND 2% PEG 600 AT AN EQUIMOLAR 5G9:TF RATIO. THE CRYSTALS GREW EXTREMELY SLOWLY, TAKING 6-9 MONTHS TO REACH A MAXIMAL SIZE OF 0.4 X 0.4 X 0.8 MM3., pH 7.0

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 142.3 α = 90
b = 73.31 β = 90.89
c = 115.83 γ = 90
Symmetry
Space Group P 1 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 297
Diffraction Detector
Detector Diffraction Type Details Collection Date
AREA DETECTOR SIEMENS COLLIMATOR 1994-05
Diffraction Radiation
Monochromator Protocol
NI FILTER --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE ELLIOTT GX-18 -- -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3 47 91.0 -- 0.135 -- 2.8 -- 42650 -- 0.0 42.4
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
3.0 3.19 87.0 -- 0.43 0.9 1.7 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 3.0 7.0 -- 1.0 -- 34656 889 78.1 -- 0.217 0.217 0.285 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 3.0 3.17 -- 77 3983 0.309 0.415 0.047 55.1
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model GROUP
Mean Isotropic B 38.2
Anisotropic B[1][1] -0.18
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 5.05
Anisotropic B[2][2] 1.68
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -1.5
RMS Deviations
Key Refinement Restraint Deviation
x_scangle_it 10.32
x_dihedral_angle_d 27.9
x_scbond_it 6.83
x_angle_deg 2.2
x_mcangle_it 6.91
x_mcbond_it 4.28
x_bond_d 0.017
x_improper_angle_d 1.84
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.35
Luzzati Sigma A (Observed) 0.59
Luzzati Resolution Cutoff (Low) 5.0
Luzzati ESD (R-Free Set) 0.52
Luzzati Sigma A (R-Free Set) 0.85
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 9834
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 0

Software

Software
Software Name Purpose
XENGEN data collection
XENGEN data reduction
TFFC model building
X-PLOR model building version: 3.1
X-PLOR refinement version: 3.1
XENGEN data scaling
TFFC phasing
X-PLOR phasing version: 3.1