X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 86.3 α = 90
b = 94.65 β = 100.03
c = 121.66 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE RIGAKU RAXIS IIC -- 1995-05-22
Diffraction Radiation
Monochromator Protocol
-- --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
-- -- -- -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
-- -- 87.0 0.12 -- -- 2.0 -- 34754 -- 1.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 3.0 8.0 -- 1.0 -- 32781 -- -- -- 0.225 0.225 0.305 --
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 19.0
RMS Deviations
Key Refinement Restraint Deviation
x_bond_d 0.01
x_angle_deg 2.0
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.33
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 11156
Nucleic Acid Atoms 0
Heterogen Atoms 232
Solvent Atoms 9

Software

Computing
Computing Package Purpose
R-AXIS IIC (HAGASHI/RIGAKU) Data Reduction (intensity integration)
X-PLOR Structure Refinement
Software
Software Name Purpose
X-PLOR refinement