X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 73.42 α = 90
b = 93.63 β = 90
c = 119.47 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Detector
Detector Diffraction Type Details Collection Date
AREA DETECTOR SIEMENS-NICOLET X100 -- 1900-01-01
Diffraction Radiation
Monochromator Protocol
-- --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
-- -- -- -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.5 15 99.0 0.06 -- -- 3.24 -- 104085 -- 2.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 2.5 5.0 -- 0.0 -- 27502 -- -- -- 0.206 0.206 -- --
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 25.5
RMS Deviations
Key Refinement Restraint Deviation
x_improper_angle_d 1.64
x_bond_d 0.015
x_angle_deg 1.7
x_dihedral_angle_d 24.8
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.25
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 6642
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 439

Software

Computing
Computing Package Purpose
XENGEN Data Reduction (intensity integration)
X-PLOR Structure Refinement
Software
Software Name Purpose
X-PLOR refinement