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X-RAY DIFFRACTION
Materials and Methods page
194L
  •   Crystallization Hide
    Crystallization Experiments
    pH 4.3
    Details pH 4.3
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 78.65 α = 90
    b = 78.65 β = 90
    c = 37.76 γ = 90
     
    Space Group
    Space Group Name:    P 43 21 2
     
     
  •   Diffraction Hide
    Diffraction Detector
    Detector IMAGE PLATE
    Type MARRESEARCH
    Collection Date 1993-09-01
     
    Diffraction Radiation
     
    Diffraction Source
    Source SYNCHROTRON
    Type LURE BEAMLINE DW32
    Wavelength 0.901
    Site LURE
    Beamline DW32
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.4
    Resolution(Low) 15
    Number Reflections(Observed) 21542
    Percent Possible(Observed) 90.2
    R Merge I(Observed) 0.027
     
     
  •   Refinement Hide
    Refinement Statistics
    reflnsShellList 1.4
    Resolution(Low) 7.0
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 21086
    R-Factor(Observed) 0.183
    R-Work 0.183
    R-Free 0.226
     
    Temperature Factor Modeling
    Mean Isotropic B Value 21.1
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    x_bond_d 0.008
    x_angle_deg 1.241
    x_dihedral_angle_d 23.47
     
    Coordinate Error
    Luzzati ESD(Observed) 0.15
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1001
    Nucleic Acid Atoms 0
    Heterogen Atoms 2
    Solvent Atoms 138
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) MOSFLM
    Structure Solution X-PLOR 3.1
    Structure Refinement X-PLOR 3.1
     
    Software
    refinement X-PLOR version: 3.1
    model building X-PLOR version: 3.1
    data collection MOSFLM