X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 7.6
Temperature 277.0
Details pH 7.60, VAPOR DIFFUSION, SITTING DROP, temperature 277.00K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 32.27 α = 90
b = 25.56 β = 115.77
c = 34.71 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 277
Diffraction Detector
Detector Diffraction Type Details Collection Date
AREA DETECTOR SDMS -- --
Diffraction Radiation
Monochromator Protocol
-- --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU RU200 -- -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.6 -- -- -- -- -- -- 12930 3290 -- 2.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 1.6 10.0 -- 2.0 -- 3290 -- 95.4 -- 0.234 0.234 -- --
RMS Deviations
Key Refinement Restraint Deviation
x_bond_d 0.02
x_angle_deg 3.6
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 0
Nucleic Acid Atoms 203
Heterogen Atoms 0
Solvent Atoms 42

Software

Computing
Computing Package Purpose
X-PLOR Structure Refinement
Software
Software Name Purpose
X-PLOR refinement