X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 7
Temperature 277.0
Details pH 7.00, VAPOR DIFFUSION, SITTING DROP, temperature 277.00K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 24.78 α = 90
b = 41.16 β = 90
c = 65.51 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 289
Diffraction Detector
Detector Diffraction Type Details Collection Date
AREA DETECTOR XENTRONICS -- --
Diffraction Radiation
Monochromator Protocol
-- --
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE -- -- -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.2 -- -- 0.053 -- -- -- 12110 3410 -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
-- 2.2 8.0 -- 2.0 -- 842 -- 90.8 -- 0.155 0.155 -- --
RMS Deviations
Key Refinement Restraint Deviation
x_bond_d 0.022
x_angle_deg 4.0
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 0
Nucleic Acid Atoms 486
Heterogen Atoms 23
Solvent Atoms 73

Software

Computing
Computing Package Purpose
XENGEN Data Reduction (data scaling)
X-PLOR Structure Refinement
Software
Software Name Purpose
X-PLOR refinement